Performance Analysis of Variable Reluctance Linear Resolver by Parametric Magnetic Equivalent Circuit in Healthy and Faulty Cases

Journal Article

Peyman Naderi, Arman Ramezannezhad, Lieven Vandevelde

Performance Analysis of Variable Reluctance Linear Resolver by Parametric Magnetic Equivalent Circuit in Healthy and Faulty Cases

IEEE Sensors Journal, Vol. 21, Iss. 18, 15 September 2021, pp. 19912–19921

Keywords:End-effect; magnetic equivalent circuit (MEC); saturation effect; variable reluctance linear resolver (VR-L-resolver); position error
Publication date:
DOI:10.1109/jsen.2021.3094798
HANDLE:1854/LU-8715012
Web of Science:WOS:000703056000031